Kuan-Hsun Duh, Cheng-Wen Wu, Ming-Der Shieh, Chao-Hsun Chen, Ming-Yan Fan. Aging Impact of Power MOSFETs in Charger with Different Operation Frequency. In IEEE 31st Asian Test Symposium, ATS 2022, Taichung City, Taiwan, November 21-24, 2022. pages 54-59, IEEE, 2022. [doi]
@inproceedings{DuhWSCF22,
title = {Aging Impact of Power MOSFETs in Charger with Different Operation Frequency},
author = {Kuan-Hsun Duh and Cheng-Wen Wu and Ming-Der Shieh and Chao-Hsun Chen and Ming-Yan Fan},
year = {2022},
doi = {10.1109/ATS56056.2022.00022},
url = {https://doi.org/10.1109/ATS56056.2022.00022},
researchr = {https://researchr.org/publication/DuhWSCF22},
cites = {0},
citedby = {0},
pages = {54-59},
booktitle = {IEEE 31st Asian Test Symposium, ATS 2022, Taichung City, Taiwan, November 21-24, 2022},
publisher = {IEEE},
isbn = {978-1-6654-7227-2},
}