Aging Impact of Power MOSFETs in Charger with Different Operation Frequency

Kuan-Hsun Duh, Cheng-Wen Wu, Ming-Der Shieh, Chao-Hsun Chen, Ming-Yan Fan. Aging Impact of Power MOSFETs in Charger with Different Operation Frequency. In IEEE 31st Asian Test Symposium, ATS 2022, Taichung City, Taiwan, November 21-24, 2022. pages 54-59, IEEE, 2022. [doi]

Abstract

Abstract is missing.