Stephen M. Dunn, D. G. Balazich, Lawrence K. Lange, Charlotte C. Montillo. Pattern generator card, emulation, and debug. In 11th IEEE VLSI Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993, Atlantic City, NJ, USA. pages 358-360, IEEE, 1993. [doi]
@inproceedings{DunnBLM93,
title = {Pattern generator card, emulation, and debug},
author = {Stephen M. Dunn and D. G. Balazich and Lawrence K. Lange and Charlotte C. Montillo},
year = {1993},
doi = {10.1109/VTEST.1993.313379},
url = {http://dx.doi.org/10.1109/VTEST.1993.313379},
researchr = {https://researchr.org/publication/DunnBLM93},
cites = {0},
citedby = {0},
pages = {358-360},
booktitle = {11th IEEE VLSI Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993, Atlantic City, NJ, USA},
publisher = {IEEE},
isbn = {0-8186-3830-3},
}