System to Optimize Test Quality and Efficiency for Memories and LSI - researchr publication authors

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Robert G. Dunn, A. Kwan, David P. Rodgers, D. Sandstrom, C. Sie. System to Optimize Test Quality and Efficiency for Memories and LSI. In Proceedings International Test Conference 1981, Philadelphia, PA, USA, October 1981. pages 31-37, IEEE Computer Society, 1981.

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