Robert G. Dunn, A. Kwan, David P. Rodgers, D. Sandstrom, C. Sie. System to Optimize Test Quality and Efficiency for Memories and LSI. In Proceedings International Test Conference 1981, Philadelphia, PA, USA, October 1981. pages 31-37, IEEE Computer Society, 1981.
@inproceedings{DunnKRSS81,
title = {System to Optimize Test Quality and Efficiency for Memories and LSI},
author = {Robert G. Dunn and A. Kwan and David P. Rodgers and D. Sandstrom and C. Sie},
year = {1981},
tags = {optimization, testing, C++},
researchr = {https://researchr.org/publication/DunnKRSS81},
cites = {0},
citedby = {0},
pages = {31-37},
booktitle = {Proceedings International Test Conference 1981, Philadelphia, PA, USA, October 1981},
publisher = {IEEE Computer Society},
}