External Links

Cite Key

Statistics

  • References: 0
  • Cited by: 0
  • Reviews: 0
  • Bibliographies: 0

PDF

Tags

Researchr

Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.

Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.

Thermal and electrostatic reliability characterization in RF MEMS switches

Q.-H. Duong, L. Buchaillot, D. Collard, P. Schmitt, X. Lafontan, P. Pons, F. Flourens, F. Pressecq. Thermal and electrostatic reliability characterization in RF MEMS switches. Microelectronics Reliability, 45(9-11):1790-1793, 2005. [doi]

References

No references recorded for this publication.

Cited by

No citations of this publication recorded.

runs on