The following publications are possibly variants of this publication:
- Kelvin probe microscopy for reliability investigation of RF-MEMS capacitive switchesA. Belarni, M. Lamhamdi, Patrick Pons, L. Boudou, J. Guastavino, Y. Segui, G. Papaioannou, Robert Plana. mr, 48(8-9):1232-1236, 2008. [doi]
- Voltage and temperature effect on dielectric charging for RF-MEMS capacitive switches reliability investigationM. Lamhamdi, Patrick Pons, U. Zaghloul, L. Boudou, Fabio Coccetti, J. Guastavino, Y. Segui, G. Papaioannou, Robert Plana. mr, 48(8-9):1248-1252, 2008. [doi]