Patrick Pons - researchr alias

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Viewing Publication 1 - 26 from 26

2023

2022

Frequency Bandwidth of Pressure Sensors Dedicated to Blast ExperimentsMathieu Chalnot, Patrick Pons, Hervé Aubert. sensors, 22(10):3790, 2022. [doi]

Transient Response of Miniature Piezoresistive Pressure Sensor Dedicated to Blast Wave MonitoringKevin Sanchez, Bilel Achour, Antony Coustou, Aurélie Lecestre, Samuel Charlot, Maylis Lavayssière, Alexandre Lefrançois, Hervé Aubert, Patrick Pons. sensors, 22(24):9571, 2022. [doi]

2021

Microelectromechanical Transducer to Monitor High-Doses of Nuclear IrradiationJulien Philippe, Muriel Ferry, Samuel Charlot, Sandrine Assié, Aurélie Lecestre, Guillaume Libaude, André Ferrand, Patrick Pons, Hervé Aubert. sensors, 21(17):5912, 2021. [doi]

2019

Radar Imaging Approach for Zero-Power Millimeter-Wave Wireless SensorsDominique Henry, Hervé Aubert, Patrick Pons. rfidta 2019: 89-94 [doi]

In-Situ Wireless Pressure Measurement Using Zero-Power Packaged Microwave SensorsJulien Philippe, Maria Valeria De Paolis, Dominique Henry, Alexandre Rumeau, Antony Coustou, Patrick Pons, Hervé Aubert. sensors, 19(6):1263, 2019. [doi]

2018

Modeling of Microfluidically Tuned Capacitor for RF ApplicationsNizar Habbachi, Ali Boukabache, Hatem Boussetta, Patrick Pons, Mohamed Adel Kallala, Kamel Besbes. IEEEssd 2018: 816-820 [doi]

Design and Simulation of a 10 GHz VCO Using an RF MEMS Solenoid InductorNizar Habbachi, Ali Boukabache, Hatem Boussetta, Patrick Pons, Mohamed Adel Kallala, Kamel Besbes. IEEEssd 2018: 420-424 [doi]

2013

Wireless sensing and identification based on radar cross section variability measurement of passive electromagnetic sensorsHervé Aubert, Franck Chebila, Mehdi Jatlaoui, Trang T. Thai, Hamida Hallil, Anya Traille, Sofiene Bouaziz, Ayoub Rifaï, Patrick Pons, Philippe Ménini, Manos M. Tentzeris. adt, 68(7-8):425-435, 2013. [doi]

2012

Wireless sensing and identification of passive electromagnetic sensors based on millimetre-wave FMCW RADARHervé Aubert, Franck Chebila, Mehdi Jatlaoui, Trang T. Thai, Hamida Hallil, Anya Traille, Sofiene Bouaziz, Ayoub Rifaï, Patrick Pons, Philippe Ménini, Manos M. Tentzeris. rfidta 2012: 398-403 [doi]

2011

On the reliability of electrostatic NEMS/MEMS devices: Review of present knowledge on the dielectric charging and stiction failure mechanisms and novel characterization methodologiesUsama Zaghloul, George Papaioannou, Bharat Bhushan, Fabio Coccetti, Patrick Pons, Robert Plana. mr, 51(9-11):1810-1818, 2011. [doi]

Erratum to "On the reliability of electrostatic NEMS/MEMS devices: Review of present knowledge on the dielectric charging and stiction failure mechanisms and novel characterization methodologies" [MR 51/9-11 (2011) 1810-1818]Usama Zaghloul, George Papaioannou, Bharat Bhushan, Fabio Coccetti, Patrick Pons, Robert Plana. mr, 51(12):2416, 2011. [doi]

2010

Methods to improve reliability of bulge test technique to extract mechanical properties of thin filmsH. Youssef, A. Ferrand, P. Calmon, Patrick Pons, Robert Plana. mr, 50(9-11):1888-1893, 2010. [doi]

Assessment of dielectric charging in electrostatically driven MEMS devices: A comparison of available characterization techniquesU. Zaghloul, M. Koutsoureli, H. Wang, Fabio Coccetti, G. Papaioannou, Patrick Pons, Robert Plana. mr, 50(9-11):1615-1620, 2010. [doi]

2009

Dielectric charging in silicon nitride films for MEMS capacitive switches: Effect of film thickness and deposition conditionsU. Zaghloul, G. Papaioannou, Fabio Coccetti, Patrick Pons, Robert Plana. mr, 49(9-11):1309-1314, 2009. [doi]

2008

2007

Structure dependent charging process in RF MEMS capacitive switchesE. Papandreou, M. Lamhamdi, C. M. Skoulikidou, Patrick Pons, G. Papaioannou, Robert Plana. mr, 47(9-11):1812-1817, 2007. [doi]

2003

Effect of the membrane flatness defect on the offset voltage of a silicon piezoresistive pressure sensorZohir Dibi, Ali Boukabache, Patrick Pons. icecsys 2003: 902-905 [doi]

Application of MEMS behavioral simulation to Physics of Failure (PoF) modelingPetra Schmitt, Francis Pressecq, Xavier Lafontan, Q.-H. Duong, Patrick Pons, Jean Marc Nicot, Coumar Oudéa, Daniel Estève, Jean-Yves Fourniols, Henri Camon. mr, 43(9-11):1957-1962, 2003. [doi]

2000

Effect of the silicon membrane flatness defect on the piezoresistive pressure sensor responseZohir Dibi, Ali Boukabache, Patrick Pons. icecsys 2000: 853-856 [doi]

1999

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