Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
H. Youssef, A. Ferrand, P. Calmon, Patrick Pons, Robert Plana. Methods to improve reliability of bulge test technique to extract mechanical properties of thin films. Microelectronics Reliability, 50(9-11):1888-1893, 2010. [doi]
Abstract is missing.