Dielectric charging in silicon nitride films for MEMS capacitive switches: Effect of film thickness and deposition conditions

U. Zaghloul, G. Papaioannou, Fabio Coccetti, Patrick Pons, Robert Plana. Dielectric charging in silicon nitride films for MEMS capacitive switches: Effect of film thickness and deposition conditions. Microelectronics Reliability, 49(9-11):1309-1314, 2009. [doi]

Abstract

Abstract is missing.