Avijit Dutta, Nur A. Touba. Multiple Bit Upset Tolerant Memory Using a Selective Cycle Avoidance Based SEC-DED-DAEC Code. In 25th IEEE VLSI Test Symposium (VTS 2007), 6-10 May 2007, Berkeley, California, USA. pages 349-354, IEEE Computer Society, 2007. [doi]
@inproceedings{DuttaT07:0,
title = {Multiple Bit Upset Tolerant Memory Using a Selective Cycle Avoidance Based SEC-DED-DAEC Code},
author = {Avijit Dutta and Nur A. Touba},
year = {2007},
doi = {10.1109/VTS.2007.40},
url = {http://dx.doi.org/10.1109/VTS.2007.40},
tags = {rule-based},
researchr = {https://researchr.org/publication/DuttaT07%3A0},
cites = {0},
citedby = {0},
pages = {349-354},
booktitle = {25th IEEE VLSI Test Symposium (VTS 2007), 6-10 May 2007, Berkeley, California, USA},
publisher = {IEEE Computer Society},
}