An on-chip delay measurements module for nanostructures characterization

Olivier Duval, Yvon Savaria. An on-chip delay measurements module for nanostructures characterization. In ISCAS (4). pages 721-724, 2004.

Authors

Olivier Duval

This author has not been identified. Look up 'Olivier Duval' in Google

Yvon Savaria

This author has not been identified. Look up 'Yvon Savaria' in Google