Olivier Duval, Yvon Savaria. An on-chip delay measurements module for nanostructures characterization. In ISCAS (4). pages 721-724, 2004.
@inproceedings{DuvalS04:0,
title = {An on-chip delay measurements module for nanostructures characterization},
author = {Olivier Duval and Yvon Savaria},
year = {2004},
researchr = {https://researchr.org/publication/DuvalS04%3A0},
cites = {0},
citedby = {0},
pages = {721-724},
booktitle = {ISCAS (4)},
}