Frederic Duvivier. Automatic Detection of Spatial Signature on Wafermaps in a High Volume Production. In 14th International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 99), November 1-3, 1999, Albuquerque, NM, USA, Proceedings. pages 61, IEEE Computer Society, 1999. [doi]
@inproceedings{Duvivier99,
title = {Automatic Detection of Spatial Signature on Wafermaps in a High Volume Production},
author = {Frederic Duvivier},
year = {1999},
url = {http://computer.org/proceedings/dft/0325/03250061abs.htm},
researchr = {https://researchr.org/publication/Duvivier99},
cites = {0},
citedby = {0},
pages = {61},
booktitle = {14th International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 99), November 1-3, 1999, Albuquerque, NM, USA, Proceedings},
publisher = {IEEE Computer Society},
isbn = {0-7695-0325-X},
}