Frederic Duvivier. Automatic Detection of Spatial Signature on Wafermaps in a High Volume Production. In 14th International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 99), November 1-3, 1999, Albuquerque, NM, USA, Proceedings. pages 61, IEEE Computer Society, 1999. [doi]
Abstract is missing.