Oleg V. Dvornikov, Nikolay N. Prokopenko, Vladimir A. Tchekhovski, Yaroslav D. Galkin, Alexei V. Kunz, Anna V. Bugakova. Test Chip for Identifying Spice-Parameters of Cryogenic BiFET Circuits. In 49th European Solid-State Device Research Conference, ESSDERC 2019, Cracow, Poland, September 23-26, 2019. pages 102-105, IEEE, 2019. [doi]
Abstract is missing.