Jennifer Dworak. An Investigation of Excitation Balance and Additional Mandatory Conditions for the Diagnosis of Fortuitously Detected Defects. In Magdy S. Abadir, Li-C. Wang, editors, Sixth International Workshop on Microprocessor Test and Verification (MTV 2005), Common Challenges and Solutions, 3-4 November 2005, Austin, Texas, USA. pages 48-54, IEEE Computer Society, 2005. [doi]
Abstract is missing.