Balanced Excitation and Its Effect on the Fortuitous Detection of Dynamic Defects

Jennifer Dworak, Brad Cobb, James Wingfield, M. Ray Mercer. Balanced Excitation and Its Effect on the Fortuitous Detection of Dynamic Defects. In 2004 Design, Automation and Test in Europe Conference and Exposition (DATE 2004), 16-20 February 2004, Paris, France. pages 1066-1071, IEEE Computer Society, 2004. [doi]

Authors

Jennifer Dworak

This author has not been identified. Look up 'Jennifer Dworak' in Google

Brad Cobb

This author has not been identified. Look up 'Brad Cobb' in Google

James Wingfield

This author has not been identified. Look up 'James Wingfield' in Google

M. Ray Mercer

This author has not been identified. Look up 'M. Ray Mercer' in Google