Jennifer Dworak, Brad Cobb, James Wingfield, M. Ray Mercer. Balanced Excitation and Its Effect on the Fortuitous Detection of Dynamic Defects. In 2004 Design, Automation and Test in Europe Conference and Exposition (DATE 2004), 16-20 February 2004, Paris, France. pages 1066-1071, IEEE Computer Society, 2004. [doi]
Abstract is missing.