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Enhanced DO-RE-ME based defect level prediction using defect site aggregation-MPG-D

Jennifer Dworak, Michael R. Grimaila, Sooryong Lee, Li-C. Wang, M. Ray Mercer. Enhanced DO-RE-ME based defect level prediction using defect site aggregation-MPG-D. In Proceedings IEEE International Test Conference 2000, Atlantic City, NJ, USA, October 2000. pages 930-939, IEEE Computer Society, 2000.

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