Timothy J. Dysart, Peter M. Kogge. Analyzing the Inherent Reliability of Moderately Sized Magnetic and Electrostatic QCA Circuits Via Probabilistic Transfer Matrices. IEEE Trans. VLSI Syst., 17(4):507-516, 2009. [doi]
@article{DysartK09-0,
title = {Analyzing the Inherent Reliability of Moderately Sized Magnetic and Electrostatic QCA Circuits Via Probabilistic Transfer Matrices},
author = {Timothy J. Dysart and Peter M. Kogge},
year = {2009},
doi = {10.1109/TVLSI.2008.2008092},
url = {http://dx.doi.org/10.1109/TVLSI.2008.2008092},
tags = {reliability},
researchr = {https://researchr.org/publication/DysartK09-0},
cites = {0},
citedby = {0},
journal = {IEEE Trans. VLSI Syst.},
volume = {17},
number = {4},
pages = {507-516},
}