Analyzing the Inherent Reliability of Moderately Sized Magnetic and Electrostatic QCA Circuits Via Probabilistic Transfer Matrices

Timothy J. Dysart, Peter M. Kogge. Analyzing the Inherent Reliability of Moderately Sized Magnetic and Electrostatic QCA Circuits Via Probabilistic Transfer Matrices. IEEE Trans. VLSI Syst., 17(4):507-516, 2009. [doi]

Abstract

Abstract is missing.