2 in 7nm FinFET

Matthias Eberlein, Harald Pretl. 2 in 7nm FinFET. In International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2021, Hsinchu, Taiwan, April 19-22, 2021. pages 1-4, IEEE, 2021. [doi]

Abstract

Abstract is missing.