Wolfgang Ecker, Peer Adelt, Wolfgang Müller 0003, Reinhold Heckmann, Milos Krstic, Vladimir Herdt, Rolf Drechsler, Gerhard Angst, Ralf Wimmer 0001, Andreas Mauderer, Rafael Stahl, Karsten Emrich, Daniel Mueller-Gritschneder, Bernd Becker 0001, Philipp Scholl, Eyck Jentzsch, Jan Schlamelcher, Kim Grüttner, Paul Palomero Bernardo, Oliver Bringmann 0001, Mihaela Damian, Julian Oppermann, Andreas Koch 0001, Jörg Bormann, Johannes Partzsch, Christian Mayr 0001, Wolfgang Kunz. The Scale4Edge RISC-V Ecosystem. In Cristiana Bolchini, Ingrid Verbauwhede, Ioana Vatajelu, editors, 2022 Design, Automation & Test in Europe Conference & Exhibition, DATE 2022, Antwerp, Belgium, March 14-23, 2022. pages 808-813, IEEE, 2022. [doi]
@inproceedings{EckerAMHKHDAWMS22,
title = {The Scale4Edge RISC-V Ecosystem},
author = {Wolfgang Ecker and Peer Adelt and Wolfgang Müller 0003 and Reinhold Heckmann and Milos Krstic and Vladimir Herdt and Rolf Drechsler and Gerhard Angst and Ralf Wimmer 0001 and Andreas Mauderer and Rafael Stahl and Karsten Emrich and Daniel Mueller-Gritschneder and Bernd Becker 0001 and Philipp Scholl and Eyck Jentzsch and Jan Schlamelcher and Kim Grüttner and Paul Palomero Bernardo and Oliver Bringmann 0001 and Mihaela Damian and Julian Oppermann and Andreas Koch 0001 and Jörg Bormann and Johannes Partzsch and Christian Mayr 0001 and Wolfgang Kunz},
year = {2022},
doi = {10.23919/DATE54114.2022.9774593},
url = {https://doi.org/10.23919/DATE54114.2022.9774593},
researchr = {https://researchr.org/publication/EckerAMHKHDAWMS22},
cites = {0},
citedby = {0},
pages = {808-813},
booktitle = {2022 Design, Automation & Test in Europe Conference & Exhibition, DATE 2022, Antwerp, Belgium, March 14-23, 2022},
editor = {Cristiana Bolchini and Ingrid Verbauwhede and Ioana Vatajelu},
publisher = {IEEE},
isbn = {978-3-9819263-6-1},
}