Diagnosis of scan path failures

Samantha Edirisooriya, Geetani Edirisooriya. Diagnosis of scan path failures. In 13th IEEE VLSI Test Symposium (VTS 95), April 30 - May 3, 1995, Princeton, New Jersey, USA. pages 250-255, IEEE Computer Society, 1995. [doi]

Authors

Samantha Edirisooriya

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Geetani Edirisooriya

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