Samantha Edirisooriya, Geetani Edirisooriya. Diagnosis of scan path failures. In 13th IEEE VLSI Test Symposium (VTS 95), April 30 - May 3, 1995, Princeton, New Jersey, USA. pages 250-255, IEEE Computer Society, 1995. [doi]
@inproceedings{EdirisooriyaE95,
title = {Diagnosis of scan path failures},
author = {Samantha Edirisooriya and Geetani Edirisooriya},
year = {1995},
url = {http://csdl.computer.org/comp/proceedings/vts/1995/7000/00/70000250abs.htm},
researchr = {https://researchr.org/publication/EdirisooriyaE95},
cites = {0},
citedby = {0},
pages = {250-255},
booktitle = {13th IEEE VLSI Test Symposium (VTS 95), April 30 - May 3, 1995, Princeton, New Jersey, USA},
publisher = {IEEE Computer Society},
}