Hal Edwards, Niu Jin, Fan-Chi Hou, Li Jen Choi, Tracey Krakowski, Kuntal Joardar. Temperature dependence of threshold voltage fluctuations in CMOS transistors incorporating halo implant. In 44th European Solid State Device Research Conference, ESSDERC 2014, Venice Lido, Italy, September 22-26, 2014. pages 413-416, IEEE, 2014. [doi]
Abstract is missing.