Aristides Efthymiou. Initialization-Based Test Pattern Generation for Asynchronous Circuits. IEEE Trans. VLSI Syst., 18(4):591-601, 2010. [doi]
@article{Efthymiou10,
title = {Initialization-Based Test Pattern Generation for Asynchronous Circuits},
author = {Aristides Efthymiou},
year = {2010},
doi = {10.1109/TVLSI.2009.2013470},
url = {http://dx.doi.org/10.1109/TVLSI.2009.2013470},
tags = {rule-based, testing},
researchr = {https://researchr.org/publication/Efthymiou10},
cites = {0},
citedby = {0},
journal = {IEEE Trans. VLSI Syst.},
volume = {18},
number = {4},
pages = {591-601},
}