Stephan Eggersglüß, Kohei Miyase, Xiaoqing Wen. SAT-based post-processing for regional capture power reduction in at-speed scan test generation. In 21th IEEE European Test Symposium, ETS 2016, Amsterdam, Netherlands, May 23-27, 2016. pages 1-6, IEEE, 2016. [doi]
@inproceedings{EggersglussMW16,
title = {SAT-based post-processing for regional capture power reduction in at-speed scan test generation},
author = {Stephan Eggersglüß and Kohei Miyase and Xiaoqing Wen},
year = {2016},
doi = {10.1109/ETS.2016.7519327},
url = {http://dx.doi.org/10.1109/ETS.2016.7519327},
researchr = {https://researchr.org/publication/EggersglussMW16},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {21th IEEE European Test Symposium, ETS 2016, Amsterdam, Netherlands, May 23-27, 2016},
publisher = {IEEE},
isbn = {978-1-4673-9659-2},
}