Stephan Eggersglüß, Kohei Miyase, Xiaoqing Wen. SAT-based post-processing for regional capture power reduction in at-speed scan test generation. In 21th IEEE European Test Symposium, ETS 2016, Amsterdam, Netherlands, May 23-27, 2016. pages 1-6, IEEE, 2016. [doi]
No reviews for this publication, yet.