Stephan Eggersglüß, Daniel Tille, Rolf Drechsler. Efficient test generation with maximal crosstalk-induced noise using unconstrained aggressor excitation. In International Symposium on Circuits and Systems (ISCAS 2010), May 30 - June 2, 2010, Paris, France. pages 649-652, IEEE, 2010. [doi]
@inproceedings{EggersglussTD10,
title = {Efficient test generation with maximal crosstalk-induced noise using unconstrained aggressor excitation},
author = {Stephan Eggersglüß and Daniel Tille and Rolf Drechsler},
year = {2010},
doi = {10.1109/ISCAS.2010.5537503},
url = {http://dx.doi.org/10.1109/ISCAS.2010.5537503},
tags = {testing},
researchr = {https://researchr.org/publication/EggersglussTD10},
cites = {0},
citedby = {0},
pages = {649-652},
booktitle = {International Symposium on Circuits and Systems (ISCAS 2010), May 30 - June 2, 2010, Paris, France},
publisher = {IEEE},
}