Heiko Ehrenberg, Bob Russell. IEEE Std 1581 - A standardized test access methodology for memory devices. In Bill Eklow, R. D. (Shawn) Blanton, editors, 2011 IEEE International Test Conference, ITC 2011, Anaheim, CA, USA, September 20-22, 2011. pages 1-9, IEEE, 2011. [doi]
Abstract is missing.