Edward B. Eichelberger, Eric Lindbloom. Random-Pattern Coverage Enhancement and Diagnosis for LSSD Logic Self-Test. IBM Journal of Research and Development, 27(3):265-272, 1983.
@article{EichelbergerL83,
title = {Random-Pattern Coverage Enhancement and Diagnosis for LSSD Logic Self-Test},
author = {Edward B. Eichelberger and Eric Lindbloom},
year = {1983},
tags = {test coverage, testing, random testing, logic, coverage},
researchr = {https://researchr.org/publication/EichelbergerL83},
cites = {0},
citedby = {0},
journal = {IBM Journal of Research and Development},
volume = {27},
number = {3},
pages = {265-272},
}