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Edward B. Eichelberger, Eric Lindbloom. Random-Pattern Coverage Enhancement and Diagnosis for LSSD Logic Self-Test. IBM Journal of Research and Development, 27(3):265-272, 1983.
Possibly Related PublicationsThe following publications are possibly variants of this publication: An LSSD Pseudo Random Pattern Test SystemFranco Motika, John A. Waicukauski, Edward B. Eichelberger, Eric Lindbloom. itc 1983: 283-288
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