Makoto Eiki, Tomoki Nakamura, Masuo Kajiyama, Michiko Inoue, Takashi Sato, Michihiro Shintani. Improving Efficiency and Robustness of Gaussian Process Based Outlier Detection via Ensemble Learning. In IEEE International Test Conference, ITC 2023, Anaheim, CA, USA, October 7-15, 2023. pages 132-140, IEEE, 2023. [doi]
Abstract is missing.