M. Eisele, Jörg Berthold, Doris Schmitt-Landsiedel, R. Mahnkopf. The impact of intra-die device parameter variations on path delays and on the design for yield of low voltage digital circuits. In Mark Horowitz, Jan M. Rabaey, Brock Barton, Massoud Pedram, editors, Proceedings of the 1996 International Symposium on Low Power Electronics and Design, 1996, Monterey, California, USA, August 12-14, 1996. pages 237-242, IEEE, 1996. [doi]
@inproceedings{EiseleBSM96,
title = {The impact of intra-die device parameter variations on path delays and on the design for yield of low voltage digital circuits},
author = {M. Eisele and Jörg Berthold and Doris Schmitt-Landsiedel and R. Mahnkopf},
year = {1996},
doi = {10.1145/252493.252611},
url = {http://doi.acm.org/10.1145/252493.252611},
tags = {design},
researchr = {https://researchr.org/publication/EiseleBSM96},
cites = {0},
citedby = {0},
pages = {237-242},
booktitle = {Proceedings of the 1996 International Symposium on Low Power Electronics and Design, 1996, Monterey, California, USA, August 12-14, 1996},
editor = {Mark Horowitz and Jan M. Rabaey and Brock Barton and Massoud Pedram},
publisher = {IEEE},
isbn = {0-7803-3571-6},
}