M. Eisele, Jörg Berthold, Doris Schmitt-Landsiedel, R. Mahnkopf. The impact of intra-die device parameter variations on path delays and on the design for yield of low voltage digital circuits. In Mark Horowitz, Jan M. Rabaey, Brock Barton, Massoud Pedram, editors, Proceedings of the 1996 International Symposium on Low Power Electronics and Design, 1996, Monterey, California, USA, August 12-14, 1996. pages 237-242, IEEE, 1996. [doi]
Abstract is missing.