Abdulaziz Eker, Oguz Ergin. Using value similarity of registers for soft error mitigation. In 2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFTS 2015, Amherst, MA, USA, October 12-14, 2015. pages 91-96, IEEE, 2015. [doi]
Abstract is missing.