Aiman El-Maleh, Ali Al-Suwaiyan. An efficient test relaxation technique for combinational circuits based on critical path tracing. In Proceedings of the 2002 9th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2002, Dubrovnik, Croatia, September 15-18, 2002. pages 461-465, IEEE, 2002. [doi]
Abstract is missing.