Aiman H. El-Maleh, Khaled Al-Utaibi. An Efficient Test Relaxation Technique for Synchronous Sequential Circuits. In 21st IEEE VLSI Test Symposium (VTS 2003), 27 April - 1 May 2003, Napa Valley, CA, USA. pages 179-185, IEEE Computer Society, 2003. [doi]
Abstract is missing.