Aiman H. El-Maleh, S. Saqib Khursheed, Sadiq M. Sait. Efficient Static Compaction Techniques for Sequential Circuits Based on Reverse Order Restoration and Test Relaxation. In 14th Asian Test Symposium (ATS 2005), 18-21 December 2005, Calcutta, India. pages 378-385, IEEE Computer Society, 2005. [doi]
@inproceedings{El-MalehKS05,
title = {Efficient Static Compaction Techniques for Sequential Circuits Based on Reverse Order Restoration and Test Relaxation},
author = {Aiman H. El-Maleh and S. Saqib Khursheed and Sadiq M. Sait},
year = {2005},
doi = {10.1109/ATS.2005.53},
url = {http://doi.ieeecomputersociety.org/10.1109/ATS.2005.53},
tags = {rule-based, testing},
researchr = {https://researchr.org/publication/El-MalehKS05},
cites = {0},
citedby = {0},
pages = {378-385},
booktitle = {14th Asian Test Symposium (ATS 2005), 18-21 December 2005, Calcutta, India},
publisher = {IEEE Computer Society},
isbn = {0-7695-2481-8},
}