Aiman El-Maleh, Esam Khan, Saif al Zahir. A Geometric-Primitives-Based Compression Scheme for Testing Systems-on-a-Chip. In 19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA, USA. pages 54-61, IEEE Computer Society, 2001. [doi]
Abstract is missing.