A dual grain hit-miss detector for large die-stacked DRAM caches - researchr publication authors

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Michel El-Nacouzi, Islam Atta, Myrto Papadopoulou, Jason Zebchuk, Natalie D. Enright Jerger, Andreas Moshovos. A dual grain hit-miss detector for large die-stacked DRAM caches. In Enrico Macii, editor, Design, Automation and Test in Europe, DATE 13, Grenoble, France, March 18-22, 2013. pages 89-92, EDA Consortium San Jose, CA, USA / ACM DL, 2013. [doi]

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