Michel El-Nacouzi, Islam Atta, Myrto Papadopoulou, Jason Zebchuk, Natalie D. Enright Jerger, Andreas Moshovos. A dual grain hit-miss detector for large die-stacked DRAM caches. In Enrico Macii, editor, Design, Automation and Test in Europe, DATE 13, Grenoble, France, March 18-22, 2013. pages 89-92, EDA Consortium San Jose, CA, USA / ACM DL, 2013. [doi]
@inproceedings{El-NacouziAPZJM13,
title = {A dual grain hit-miss detector for large die-stacked DRAM caches},
author = {Michel El-Nacouzi and Islam Atta and Myrto Papadopoulou and Jason Zebchuk and Natalie D. Enright Jerger and Andreas Moshovos},
year = {2013},
url = {http://dl.acm.org/citation.cfm?id=2485311},
researchr = {https://researchr.org/publication/El-NacouziAPZJM13},
cites = {0},
citedby = {0},
pages = {89-92},
booktitle = {Design, Automation and Test in Europe, DATE 13, Grenoble, France, March 18-22, 2013},
editor = {Enrico Macii},
publisher = {EDA Consortium San Jose, CA, USA / ACM DL},
isbn = {978-1-4503-2153-2},
}