Yacoub M. El-Ziq, Hamid H. Butt. A Mixed-Mode Built-In Self-Test Technique Using Scan Path and Signature Analysis. In Proceedings International Test Conference 1983, Philadelphia, PA, USA, October 1983. pages 269-274, IEEE Computer Society, 1983.
@inproceedings{El-ZiqB83,
title = {A Mixed-Mode Built-In Self-Test Technique Using Scan Path and Signature Analysis},
author = {Yacoub M. El-Ziq and Hamid H. Butt},
year = {1983},
tags = {testing, analysis},
researchr = {https://researchr.org/publication/El-ZiqB83},
cites = {0},
citedby = {0},
pages = {269-274},
booktitle = {Proceedings International Test Conference 1983, Philadelphia, PA, USA, October 1983},
publisher = {IEEE Computer Society},
}