A Mixed-Mode Built-In Self-Test Technique Using Scan Path and Signature Analysis - researchr publication references

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Yacoub M. El-Ziq, Hamid H. Butt. A Mixed-Mode Built-In Self-Test Technique Using Scan Path and Signature Analysis. In Proceedings International Test Conference 1983, Philadelphia, PA, USA, October 1983. pages 269-274, IEEE Computer Society, 1983.

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