Impact of Mixed-Mode Self Test on Life Cycle Cost of VLSI Based Design - researchr publication

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Yacoub M. El-Ziq, Hamid H. Butt. Impact of Mixed-Mode Self Test on Life Cycle Cost of VLSI Based Design. In Proceedings International Test Conference 1984, Philadelphia, PA, USA, October 1984. pages 338-349, IEEE Computer Society, 1984.

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