Praveen Elakkumanan, Jente B. Kuang, Kevin J. Nowka, Ramalingam Sridhar, Rouwaida Kanj, Sani R. Nassif. SRAM Local Bit Line Access Failure Analyses. In 7th International Symposium on Quality of Electronic Design (ISQED 2006), 27-29 March 2006, San Jose, CA, USA. pages 204-209, IEEE Computer Society, 2006. [doi]
@inproceedings{ElakkumananKNSKN06,
title = {SRAM Local Bit Line Access Failure Analyses},
author = {Praveen Elakkumanan and Jente B. Kuang and Kevin J. Nowka and Ramalingam Sridhar and Rouwaida Kanj and Sani R. Nassif},
year = {2006},
doi = {10.1109/ISQED.2006.120},
url = {http://doi.ieeecomputersociety.org/10.1109/ISQED.2006.120},
researchr = {https://researchr.org/publication/ElakkumananKNSKN06},
cites = {0},
citedby = {0},
pages = {204-209},
booktitle = {7th International Symposium on Quality of Electronic Design (ISQED 2006), 27-29 March 2006, San Jose, CA, USA},
publisher = {IEEE Computer Society},
isbn = {0-7695-2523-7},
}