Ahmed T. Elthakeb, Thomas Haine, Denis Flandre, Yehea Ismail, Hamdy Abd Elhamid, David Bol. Analysis and optimization for dynamic read stability in 28nm SRAM bitcells. In 2015 IEEE International Symposium on Circuits and Systems, ISCAS 2015, Lisbon, Portugal, May 24-27, 2015. pages 1414-1417, IEEE, 2015. [doi]
Abstract is missing.