Piet Engelke, Ilia Polian, Hans Manhaeve, Michel Renovell, Bernd Becker 0001. Delta-IDDQ Testing of Resistive Short Defects. In 15th Asian Test Symposium, ATS 2006, Fukuoka, Japan, November 20-23, 2006. pages 63-68, IEEE, 2006. [doi]
Abstract is missing.